Products in the Category Detectors and Measurements
Product | Suppliers | Enc |
---|---|---|
absorption spectroscopy equipment | 10 S | |
avalanche photodiodes | 22 S | E |
autocollimators | 8 S | E |
autocorrelators | 19 S | E |
balanced photodetectors | 9 S | E |
beam characterization → laser beam characterization instruments | 34 S | E |
beam profilers | 29 S | E |
beam quality measurement devices | 27 S | E |
bit error rate testers | 7 S | E |
calorimeters → optical energy meters | 21 S | E |
cameras | 103 S | E |
carrier–envelope offset measurement and stabilization | 8 S | E |
CCD cameras → cameras | 103 S | E |
characterization of optics → optics characterization equipment | 10 S | |
chromatic dispersion measurement devices | 4 S | E |
CMOS cameras → cameras | 103 S | E |
coherence measurement devices | 2 S | E |
colorimeters | 6 S | E |
dispersion measurement devices → chromatic dispersion measurement devices | 4 S | E |
distance measurements with lasers | 12 S | E |
distributed sensors → fiber-optic sensors | 54 S | E |
dual-segment photodiodes → position-sensitive detectors | 12 S | E |
electro-optic sampling systems | 2 S | E |
ellipsometers | 4 S | |
Fabry–Perot interferometers | 18 S | E |
fiber-optic sensors | 54 S | E |
Fizeau interferometers | 2 S | E |
fluorescence microscopes | 16 S | E |
fluorescence spectroscopy equipment | 14 S | E |
force sensors → optical force and pressure sensors | 5 S | |
frequency comb sources | 15 S | E |
frequency metrology equipment | 7 S | E |
frequency-resolved optical gating devices | 11 S | E |
Gaussian beams characterization → laser beam characterization instruments | 34 S | E |
goniometers | 7 S | |
hyperspectral imaging instruments | 15 S | E |
image amplifiers → image intensifiers and image converters | 9 S | E |
image intensifiers and image converters | 9 S | E |
infrared sensor cards → laser viewing cards | 15 S | E |
image sensors | 17 S | E |
infrared cameras | 20 S | E |
infrared detectors | 14 S | E |
infrared viewers | 14 S | E |
infrared-to-visible converters | 4 S | |
intensity noise measurement equipment | 1 S | E |
interferometers | 50 S | E |
knife edge beam profilers → beam profilers | 29 S | E |
laser beam characterization instruments | 34 S | E |
laser beam profilers → beam profilers | 29 S | E |
laser distance meters → laser rangefinders | 20 S | E |
laser energy meters → optical energy meters | 21 S | E |
laser noise measurement equipment | 5 S | E |
laser power meters → optical power meters | 61 S | E |
laser trackers | 3 S | |
laser viewing cards | 15 S | E |
laser-induced breakdown spectroscopy equipment | 9 S | |
laser-induced damage threshold measurements and equipment | 6 S | |
line scan cameras | 10 S | |
linewidth measurement equipment | 21 S | E |
luxmeters → photometers | 15 S | E |
M2 factor → laser beam characterization instruments | 34 S | E |
Mach–Zehnder interferometers → interferometers | 50 S | E |
machine vision devices | 8 S | |
measurement and calibration services | 14 S | |
metal–semiconductor–metal photodetectors | 1 S | E |
Michelson interferometers | 3 S | E |
microchannel plate detectors | 9 S | E |
microscope cameras | 19 S | |
multiphoton microscopes → fluorescence microscopes | 16 S | E |
optical alignment systems | 2 S | |
optical clocks | 3 S | E |
optical damage measurements → laser-induced damage threshold measurements and equipment | 6 S | |
optical displacement sensors | 10 S | |
optical energy meters | 21 S | E |
optical force and pressure sensors | 5 S | |
optical metrology equipment | 45 S | E |
optical metrology services | 3 S | |
optical power monitors | 18 S | E |
optical power meters | 61 S | E |
optical profilometers | 9 S | E |
optical sampling systems | 2 S | E |
optical sensing instruments | 19 S | |
optical sensors | 44 S | E |
optical spectrum analyzers | 22 S | E |
optical strain sensors | 8 S | E |
optical surface characterization equipment | 13 S | |
optical surface profilers → optical profilometers | 9 S | E |
optical temperature sensors | 10 S | E |
optical thickness sensors | 5 S | |
optical tilt sensors | 3 S | |
optical time-domain reflectometers | 17 S | E |
optical vibration sensors | 8 S | |
optics characterization equipment | 10 S | |
phase noise measurement equipment | 4 S | E |
photoconductive detectors | 11 S | E |
photodetectors | 101 S | E |
photodetector arrays → photodiode arrays | 5 S | E |
photodiode amplifiers | 8 S | |
photodiode arrays | 5 S | E |
photodiodes | 59 S | E |
photometers | 15 S | E |
photomultipliers | 18 S | E |
photon counting detectors | 24 S | E |
phototransistors | 3 S | E |
phototubes | 1 S | E |
polarimeters | 8 S | E |
polarization mode dispersion measurement and compensation equipment | 4 S | E |
position-sensitive detectors | 12 S | E |
power monitors → optical power monitors | 18 S | E |
powermeters → optical power meters | 61 S | E |
pressure sensors → optical force and pressure sensors | 5 S | |
profilometers → optical profilometers | 9 S | E |
pulse characterization instruments | 30 S | E |
pulse duration measurement devices | 20 S | E |
pump–probe measurement equipment | 8 S | E |
pyroelectric detectors → optical energy meters | 21 S | E |
p–i–n photodiodes | 16 S | E |
pyroelectric detectors | 9 S | E |
quadrant photodiodes → position-sensitive detectors | 12 S | E |
radiometers | 3 S | E |
Raman spectroscopy equipment | 47 S | E |
range finders → laser rangefinders | 20 S | E |
reference cavities | 4 S | E |
reflectometers | 4 S | |
refractometers | 5 S | E |
scanning beam profilers → beam profilers | 29 S | E |
scintillation detectors | 6 S | |
Shack–Hartmann wavefront sensors | 11 S | E |
silicon detectors → photodiodes | 59 S | E |
solar-blind photodetectors | 4 S | E |
spectral phase interferometry instruments | 6 S | E |
spectrographs | 11 S | E |
spectrometers | 106 S | E |
spectrophotometers | 16 S | E |
spectroradiometers | 5 S | |
spectroscopy equipment | 67 S | E |
streak cameras | 7 S | E |
surface profilers → optical profilometers | 9 S | E |
terahertz cameras | 8 S | |
terahertz detectors | 21 S | E |
terahertz reflectometers | 1 S | |
terahertz spectrometers | 12 S | |
thermal imaging cameras | 13 S | E |
thermal power meters → optical power meters | 61 S | E |
thermography → thermal imaging cameras | 13 S | E |
thin-film measurement systems | 3 S | |
timing jitter measurement devices | 2 S | E |
time-of-flight measurement devices | 10 S | E |
time-resolved spectroscopy equipment | 8 S | E |
traveling-wave photodetectors → velocity-matched photodetectors | --- | E |
two-photon microscopes → fluorescence microscopes | 16 S | E |
Twyman–Green interferometers | 2 S | E |
ultraviolet sensors | 3 S | |
velocity-matched photodetectors | --- | E |
wavefront analyzers | 19 S | |
wavemeters | 21 S | E |
white light interferometers | 7 S | E |
X-ray detectors | 6 S |
If you miss certain product terms in our list, please contact us! We are happy to add more product terms where it is appropriate.