Products in the Category Detectors and Measurements
| Product | Suppliers | Enc |
|---|---|---|
| absorption spectroscopy equipment | 10 S | |
| avalanche photodiodes | 22 S | E |
| autocollimators | 8 S | E |
| autocorrelators | 19 S | E |
| balanced photodetectors | 9 S | E |
| beam characterization → laser beam characterization instruments | 34 S | E |
| beam profilers | 29 S | E |
| beam quality measurement devices | 27 S | E |
| bit error rate testers | 7 S | E |
| calorimeters → optical energy meters | 21 S | E |
| cameras | 103 S | E |
| carrier–envelope offset measurement and stabilization | 8 S | E |
| CCD cameras → cameras | 103 S | E |
| characterization of optics → optics characterization equipment | 10 S | |
| chromatic dispersion measurement devices | 4 S | E |
| CMOS cameras → cameras | 103 S | E |
| coherence measurement devices | 2 S | E |
| colorimeters | 6 S | E |
| dispersion measurement devices → chromatic dispersion measurement devices | 4 S | E |
| distance measurements with lasers | 12 S | E |
| distributed sensors → fiber-optic sensors | 54 S | E |
| dual-segment photodiodes → position-sensitive detectors | 12 S | E |
| electro-optic sampling systems | 2 S | E |
| ellipsometers | 4 S | |
| Fabry–Perot interferometers | 18 S | E |
| fiber-optic sensors | 54 S | E |
| Fizeau interferometers | 2 S | E |
| fluorescence microscopes | 16 S | E |
| fluorescence spectroscopy equipment | 14 S | E |
| force sensors → optical force and pressure sensors | 5 S | |
| frequency comb sources | 15 S | E |
| frequency metrology equipment | 7 S | E |
| frequency-resolved optical gating devices | 11 S | E |
| Gaussian beams characterization → laser beam characterization instruments | 34 S | E |
| goniometers | 7 S | |
| hyperspectral imaging instruments | 15 S | E |
| image amplifiers → image intensifiers and image converters | 9 S | E |
| image intensifiers and image converters | 9 S | E |
| infrared sensor cards → laser viewing cards | 15 S | E |
| image sensors | 17 S | E |
| infrared cameras | 20 S | E |
| infrared detectors | 14 S | E |
| infrared viewers | 14 S | E |
| infrared-to-visible converters | 4 S | |
| intensity noise measurement equipment | 1 S | E |
| interferometers | 50 S | E |
| knife edge beam profilers → beam profilers | 29 S | E |
| laser beam characterization instruments | 34 S | E |
| laser beam profilers → beam profilers | 29 S | E |
| laser distance meters → laser rangefinders | 20 S | E |
| laser energy meters → optical energy meters | 21 S | E |
| laser noise measurement equipment | 5 S | E |
| laser power meters → optical power meters | 61 S | E |
| laser trackers | 3 S | |
| laser viewing cards | 15 S | E |
| laser-induced breakdown spectroscopy equipment | 9 S | |
| laser-induced damage threshold measurements and equipment | 6 S | |
| line scan cameras | 10 S | |
| linewidth measurement equipment | 21 S | E |
| luxmeters → photometers | 15 S | E |
| M2 factor → laser beam characterization instruments | 34 S | E |
| Mach–Zehnder interferometers → interferometers | 50 S | E |
| machine vision devices | 8 S | |
| measurement and calibration services | 14 S | |
| metal–semiconductor–metal photodetectors | 1 S | E |
| Michelson interferometers | 3 S | E |
| microchannel plate detectors | 9 S | E |
| microscope cameras | 19 S | |
| multiphoton microscopes → fluorescence microscopes | 16 S | E |
| optical alignment systems | 2 S | |
| optical clocks | 3 S | E |
| optical damage measurements → laser-induced damage threshold measurements and equipment | 6 S | |
| optical displacement sensors | 10 S | |
| optical energy meters | 21 S | E |
| optical force and pressure sensors | 5 S | |
| optical metrology equipment | 45 S | E |
| optical metrology services | 3 S | |
| optical power monitors | 18 S | E |
| optical power meters | 61 S | E |
| optical profilometers | 9 S | E |
| optical sampling systems | 2 S | E |
| optical sensing instruments | 19 S | |
| optical sensors | 44 S | E |
| optical spectrum analyzers | 22 S | E |
| optical strain sensors | 8 S | E |
| optical surface characterization equipment | 13 S | |
| optical surface profilers → optical profilometers | 9 S | E |
| optical temperature sensors | 10 S | E |
| optical thickness sensors | 5 S | |
| optical tilt sensors | 3 S | |
| optical time-domain reflectometers | 17 S | E |
| optical vibration sensors | 8 S | |
| optics characterization equipment | 10 S | |
| phase noise measurement equipment | 4 S | E |
| photoconductive detectors | 11 S | E |
| photodetectors | 101 S | E |
| photodetector arrays → photodiode arrays | 5 S | E |
| photodiode amplifiers | 8 S | |
| photodiode arrays | 5 S | E |
| photodiodes | 59 S | E |
| photometers | 15 S | E |
| photomultipliers | 18 S | E |
| photon counting detectors | 24 S | E |
| phototransistors | 3 S | E |
| phototubes | 1 S | E |
| polarimeters | 8 S | E |
| polarization mode dispersion measurement and compensation equipment | 4 S | E |
| position-sensitive detectors | 12 S | E |
| power monitors → optical power monitors | 18 S | E |
| powermeters → optical power meters | 61 S | E |
| pressure sensors → optical force and pressure sensors | 5 S | |
| profilometers → optical profilometers | 9 S | E |
| pulse characterization instruments | 30 S | E |
| pulse duration measurement devices | 20 S | E |
| pump–probe measurement equipment | 8 S | E |
| pyroelectric detectors → optical energy meters | 21 S | E |
| p–i–n photodiodes | 16 S | E |
| pyroelectric detectors | 9 S | E |
| quadrant photodiodes → position-sensitive detectors | 12 S | E |
| radiometers | 3 S | E |
| Raman spectroscopy equipment | 47 S | E |
| range finders → laser rangefinders | 20 S | E |
| reference cavities | 4 S | E |
| reflectometers | 4 S | |
| refractometers | 5 S | E |
| scanning beam profilers → beam profilers | 29 S | E |
| scintillation detectors | 6 S | |
| Shack–Hartmann wavefront sensors | 11 S | E |
| silicon detectors → photodiodes | 59 S | E |
| solar-blind photodetectors | 4 S | E |
| spectral phase interferometry instruments | 6 S | E |
| spectrographs | 11 S | E |
| spectrometers | 106 S | E |
| spectrophotometers | 16 S | E |
| spectroradiometers | 5 S | |
| spectroscopy equipment | 67 S | E |
| streak cameras | 7 S | E |
| surface profilers → optical profilometers | 9 S | E |
| terahertz cameras | 8 S | |
| terahertz detectors | 21 S | E |
| terahertz reflectometers | 1 S | |
| terahertz spectrometers | 12 S | |
| thermal imaging cameras | 13 S | E |
| thermal power meters → optical power meters | 61 S | E |
| thermography → thermal imaging cameras | 13 S | E |
| thin-film measurement systems | 3 S | |
| timing jitter measurement devices | 2 S | E |
| time-of-flight measurement devices | 10 S | E |
| time-resolved spectroscopy equipment | 8 S | E |
| traveling-wave photodetectors → velocity-matched photodetectors | --- | E |
| two-photon microscopes → fluorescence microscopes | 16 S | E |
| Twyman–Green interferometers | 2 S | E |
| ultraviolet sensors | 3 S | |
| velocity-matched photodetectors | --- | E |
| wavefront analyzers | 19 S | |
| wavemeters | 21 S | E |
| white light interferometers | 7 S | E |
| X-ray detectors | 6 S |
If you miss certain product terms in our list, please contact us! We are happy to add more product terms where it is appropriate.


